TEST_NAME : Wafer
TEST_DATE : 24_08_21-19_24_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-013-007-05 | FUSED_ID : 6359364768383422581
  IC_TEMP :  -54.49 | VDDM : 1122.54 | AUX_INT :    0.00 | CsaBias :   80.30
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.29472e-03 / 2
  ADC_P0  : 0.00000e+00 ± 2.54433e-02
  ADC_P1  : 8.07880e-03 ± 4.02890e-04
  ADC_P2  : -4.84946e-06 ± 2.33095e-06
  CSA_Chi2/NDF : 1.63277e-04 / 2
  CSA_P0  : 5.90945e-02 ± 8.52286e-03
  CSA_P1  : 9.91194e-03 ± 6.42136e-04
  CSA_P2  : -4.83080e-05 ± 9.77897e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [18, 29, 36, 46, 60, 68, 81, 84, 85, 86, 100, 101, 104, 113, 115, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [7, 26, 29, 44, 46, 58, 62, 63, 83, 87, 111, 112, 120, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2838', '1.800', '0.1700', '1.800', '0.0898', '7.000', '0.7079', 1, 1, 1, 1, 1724261096.0826716]
VI_after__Init : ['1.201', '0.2841', '1.800', '0.1700', '1.801', '0.0842', '7.001', '0.7077', 1, 1, 1, 1, 1724261104.2250268]
VI_at__the_End : ['1.201', '0.4857', '1.800', '0.1366', '1.799', '0.1114', '7.000', '0.7089', 1, 1, 1, 1, 1724261166.5524993]