TEST_NAME : Wafer
TEST_DATE : 24_08_21-21_16_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-010-017-021-04 | FUSED_ID : 6359364768383439188
  IC_TEMP :  -48.95 | VDDM : 1117.48 | AUX_INT :    0.00 | CsaBias :   90.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.94437e-03 / 2
  ADC_P0  : 0.00000e+00 ± 3.83691e-02
  ADC_P1  : 7.56116e-03 ± 5.70505e-04
  ADC_P2  : -3.85259e-06 ± 3.13006e-06
  CSA_Chi2/NDF : 1.24481e-04 / 2
  CSA_P0  : 5.73346e-02 ± 7.44172e-03
  CSA_P1  : 9.33899e-03 ± 5.60680e-04
  CSA_P2  : -3.91464e-05 ± 8.53850e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [6, 50, 61, 64, 68, 85, 93, 97, 113, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  17
 | P_BROKEN_FAST :  [3, 12, 31, 36, 44, 46, 48, 53, 63, 66, 80, 95, 102, 112, 113, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2534', '1.800', '0.1475', '1.800', '0.0916', '7.000', '0.7080', 1, 1, 1, 1, 1724267768.9194772]
VI_after__Init : ['1.201', '0.2537', '1.800', '0.1475', '1.800', '0.0842', '7.000', '0.7073', 1, 1, 1, 1, 1724267777.225882]
VI_at__the_End : ['1.201', '0.4888', '1.800', '0.1324', '1.804', '0.1096', '7.000', '0.7081', 1, 1, 1, 1, 1724267844.9463801]