TEST_NAME : Wafer
TEST_DATE : 24_08_23-09_09_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-003-011-14 | FUSED_ID : 6359364768385478846
  IC_TEMP :  -70.53 | VDDM : 1113.22 | AUX_INT :  -10.08 | CsaBias :   43.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.62077e-03 / 2
  ADC_P0  : -1.00806e-02 ± 2.72435e-02
  ADC_P1  : 9.03508e-03 ± 7.02250e-04
  ADC_P2  : -7.57722e-06 ± 3.59178e-06
  CSA_Chi2/NDF : 2.08093e-04 / 2
  CSA_P0  : 5.82273e-02 ± 9.62168e-03
  CSA_P1  : 1.00082e-02 ± 7.24924e-04
  CSA_P2  : -5.87499e-05 ± 1.10397e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [1, 2, 25, 37, 38, 40, 48, 62, 69, 80, 85, 89, 97, 107, 110, 113, 114, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [5, 13, 22, 34, 48, 77, 80, 85, 87, 88, 107, 116, 125, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2145', '1.800', '0.0869', '1.803', '0.0964', '7.000', '0.7087', 1, 1, 1, 1, 1724396964.8740118]
VI_after__Init : ['1.201', '0.2147', '1.800', '0.0869', '1.804', '0.0893', '7.000', '0.7079', 1, 1, 1, 1, 1724396972.8504202]
VI_at__the_End : ['1.201', '0.4501', '1.800', '0.1361', '1.803', '0.1217', '7.000', '0.7086', 1, 1, 1, 1, 1724397042.9224513]