TEST_NAME : Wafer
TEST_DATE : 24_08_23-09_52_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-012-005-021-12 | FUSED_ID : 6359364768385487196
  IC_TEMP :  -69.21 | VDDM : 1122.09 | AUX_INT :   -9.45 | CsaBias :   60.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30084e-03 / 2
  ADC_P0  : -9.45201e-03 ± 2.43956e-02
  ADC_P1  : 8.76199e-03 ± 6.17335e-04
  ADC_P2  : -6.60843e-06 ± 3.11271e-06
  CSA_Chi2/NDF : 1.83229e-04 / 2
  CSA_P0  : 5.98370e-02 ± 9.02859e-03
  CSA_P1  : 1.03118e-02 ± 6.80239e-04
  CSA_P2  : -6.04213e-05 ± 1.03592e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  18
 | N_BROKEN_FAST :  [2, 7, 17, 19, 43, 45, 46, 47, 48, 50, 65, 71, 82, 87, 91, 93, 94, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  14
 | P_BROKEN_FAST :  [16, 20, 22, 23, 29, 41, 42, 46, 49, 56, 73, 114, 124, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2952', '1.800', '0.1501', '1.800', '0.0894', '7.000', '0.7081', 1, 1, 1, 1, 1724399547.0770006]
VI_after__Init : ['1.201', '0.2953', '1.800', '0.1499', '1.801', '0.0838', '6.995', '0.7085', 1, 1, 1, 1, 1724399555.2473598]
VI_at__the_End : ['1.201', '0.4617', '1.800', '0.1350', '1.804', '0.1210', '7.000', '0.7090', 1, 1, 1, 1, 1724399623.496076]