TEST_NAME : Wafer
TEST_DATE : 24_08_26-17_44_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-013-006-024-10 | FUSED_ID : 6359364768386539914
  IC_TEMP :  -63.42 | VDDM : 1129.63 | AUX_INT : -133.47 | CsaBias :  -40.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55297e-03 / 2
  ADC_P0  : -1.33474e-01 ± 3.37197e-02
  ADC_P1  : 1.04783e-02 ± 8.05151e-04
  ADC_P2  : -1.28278e-05 ± 3.78855e-06
  CSA_Chi2/NDF : 1.65334e-04 / 2
  CSA_P0  : 5.77307e-02 ± 8.57636e-03
  CSA_P1  : 1.00751e-02 ± 6.46167e-04
  CSA_P2  : -5.52356e-05 ± 9.84035e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  16
 | N_BROKEN_FAST :  [20, 28, 35, 43, 47, 48, 49, 59, 67, 73, 89, 97, 98, 103, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [8, 15, 26, 68, 82, 86, 94, 96, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2134', '1.800', '0.1464', '1.799', '0.0907', '7.000', '0.7079', 1, 1, 1, 1, 1724687092.506338]
VI_after__Init : ['1.202', '0.2135', '1.800', '0.1463', '1.800', '0.0835', '7.000', '0.7071', 1, 1, 1, 1, 1724687100.7888045]
VI_at__the_End : ['1.201', '0.4662', '1.800', '0.1347', '1.803', '0.1177', '7.000', '0.7078', 1, 1, 1, 1, 1724687169.0335321]