TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_03_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-002-012-10 | FUSED_ID : 6359364768387571914
  IC_TEMP :  -92.44 | VDDM : 1109.70 | AUX_INT :  -13.56 | CsaBias :   42.92
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.62864e-03 / 2
  ADC_P0  : -1.35576e-02 ± 3.47549e-02
  ADC_P1  : 9.46144e-03 ± 9.24251e-04
  ADC_P2  : -8.05142e-06 ± 4.94604e-06
  CSA_Chi2/NDF : 1.89384e-04 / 2
  CSA_P0  : 5.84504e-02 ± 9.17897e-03
  CSA_P1  : 1.05363e-02 ± 6.91569e-04
  CSA_P2  : -7.62108e-05 ± 1.05318e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [5, 64, 84, 87, 92, 104]
 | N_BROKEN_SLOW :  [58]
   P_BROKEN_DISC :  72
 | P_BROKEN_FAST :  [6, 13, 27, 33, 36, 76, 79, 103, 113, 120, 126]
 | P_BROKEN_SLOW :  [2, 3, 5, 7, 11, 15, 19, 21, 23, 27, 28, 29, 30, 31, 33, 34, 36, 39, 41, 43, 47, 48, 50, 51, 52, 54, 57, 58, 62, 63, 67, 73, 75, 77, 79, 83, 85, 86, 87, 88, 91, 93, 95, 97, 98, 101, 102, 103, 107, 109, 111, 113, 114, 115, 117, 118, 119, 123, 125, 126, 127]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2820', '1.800', '0.1421', '1.800', '0.0977', '7.000', '0.7071', 1, 1, 1, 1, 1724753003.8451207]
VI_after__Init : ['1.198', '0.2818', '1.799', '0.1424', '1.800', '0.0922', '7.000', '0.7069', 1, 1, 1, 1, 1724753012.604256]
VI_at__the_End : ['1.202', '0.4207', '1.800', '0.1336', '1.799', '0.1230', '7.000', '0.7077', 1, 1, 1, 1, 1724753074.0724838]