TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_11_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-002-017-13 | FUSED_ID : 6359364768387571997
  IC_TEMP :  -74.77 | VDDM : 1083.11 | AUX_INT :    0.94 | CsaBias :   53.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.33747e-03 / 2
  ADC_P0  : 9.38930e-04 ± 6.20315e-02
  ADC_P1  : 8.85926e-03 ± 1.70643e-03
  ADC_P2  : -5.43329e-06 ± 9.37332e-06
  CSA_Chi2/NDF : 1.40160e-04 / 2
  CSA_P0  : 6.00839e-02 ± 7.89650e-03
  CSA_P1  : 1.01365e-02 ± 5.94944e-04
  CSA_P2  : -6.94991e-05 ± 9.06030e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [6, 12, 24, 57, 79, 91, 93, 104, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [15, 43, 57, 76, 100, 112, 115, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3251', '1.800', '0.1474', '1.800', '0.0996', '7.000', '0.7072', 1, 1, 1, 1, 1724753483.861835]
VI_after__Init : ['1.201', '0.3260', '1.800', '0.1483', '1.800', '0.0938', '7.000', '0.7071', 1, 1, 1, 1, 1724753492.0781243]
VI_at__the_End : ['1.202', '0.4190', '1.799', '0.1349', '1.800', '0.1206', '7.000', '0.7081', 1, 1, 1, 1, 1724753560.5928242]