TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_40_05
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-007-07 | FUSED_ID : 6359364768387575927
  IC_TEMP :  -76.02 | VDDM : 1108.67 | AUX_INT :   -9.50 | CsaBias :   52.85
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43878e-03 / 2
  ADC_P0  : -9.49606e-03 ± 2.57061e-02
  ADC_P1  : 8.95176e-03 ± 6.70931e-04
  ADC_P2  : -6.52814e-06 ± 3.48980e-06
  CSA_Chi2/NDF : 2.41219e-04 / 2
  CSA_P0  : 5.61739e-02 ± 1.03592e-02
  CSA_P1  : 1.05418e-02 ± 7.80494e-04
  CSA_P2  : -6.83718e-05 ± 1.18860e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [19, 24, 27, 53, 57, 59, 60, 121, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [51, 77, 99, 115]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4289', '1.800', '0.1387', '1.800', '0.0980', '7.000', '0.7082', 1, 1, 1, 1, 1724755205.2775648]
VI_after__Init : ['1.201', '0.4301', '1.800', '0.1389', '1.800', '0.0922', '7.000', '0.7077', 1, 1, 1, 1, 1724755213.3730114]
VI_at__the_End : ['1.201', '0.4475', '1.800', '0.1345', '1.800', '0.1163', '7.000', '0.7085', 1, 1, 1, 1, 1724755281.6478515]