TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_36_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-009-07 | FUSED_ID : 6359364768387575959
  IC_TEMP :  -83.42 | VDDM : 1111.00 | AUX_INT :  -11.56 | CsaBias :   44.13
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.98590e-03 / 2
  ADC_P0  : -1.15580e-02 ± 3.01876e-02
  ADC_P1  : 9.32820e-03 ± 7.99091e-04
  ADC_P2  : -7.89766e-06 ± 4.22562e-06
  CSA_Chi2/NDF : 1.75032e-04 / 2
  CSA_P0  : 5.71636e-02 ± 8.82431e-03
  CSA_P1  : 1.03831e-02 ± 6.64848e-04
  CSA_P2  : -6.88915e-05 ± 1.01248e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [17, 55, 56, 81, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [37, 39, 40, 93, 101, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2117', '1.800', '0.1827', '1.800', '0.0936', '7.000', '0.7079', 1, 1, 1, 1, 1724755014.2259338]
VI_after__Init : ['1.201', '0.2117', '1.800', '0.1826', '1.800', '0.0877', '7.000', '0.7078', 1, 1, 1, 1, 1724755022.4644024]
VI_at__the_End : ['1.201', '0.4333', '1.800', '0.1337', '1.800', '0.1195', '7.000', '0.7085', 1, 1, 1, 1, 1724755088.4544358]