TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_33_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-011-07 | FUSED_ID : 6359364768387575991
  IC_TEMP :  -74.22 | VDDM : 1118.26 | AUX_INT :  -10.30 | CsaBias :   34.84
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.77502e-03 / 2
  ADC_P0  : -1.03030e-02 ± 2.85656e-02
  ADC_P1  : 9.06423e-03 ± 7.45765e-04
  ADC_P2  : -7.16483e-06 ± 3.87510e-06
  CSA_Chi2/NDF : 1.66321e-04 / 2
  CSA_P0  : 5.83212e-02 ± 8.60193e-03
  CSA_P1  : 1.00371e-02 ± 6.48094e-04
  CSA_P2  : -6.21343e-05 ± 9.86970e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [32, 52, 55, 75, 90, 103, 111, 117, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [1, 30, 51, 73, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3471', '1.800', '0.1653', '1.800', '0.0940', '7.000', '0.7080', 1, 1, 1, 1, 1724754822.4652073]
VI_after__Init : ['1.201', '0.3480', '1.800', '0.1655', '1.800', '0.0880', '7.000', '0.7077', 1, 1, 1, 1, 1724754831.3526287]
VI_at__the_End : ['1.201', '0.4379', '1.800', '0.1351', '1.800', '0.1149', '7.000', '0.7083', 1, 1, 1, 1, 1724754900.2745004]