TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_32_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-012-07 | FUSED_ID : 6359364768387576007
  IC_TEMP :  -85.61 | VDDM : 1116.14 | AUX_INT :  -10.67 | CsaBias :   33.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63332e-03 / 2
  ADC_P0  : -1.06749e-02 ± 2.73269e-02
  ADC_P1  : 8.89849e-03 ± 6.87815e-04
  ADC_P2  : -7.45423e-06 ± 3.44763e-06
  CSA_Chi2/NDF : 1.36367e-04 / 2
  CSA_P0  : 5.62218e-02 ± 7.78892e-03
  CSA_P1  : 1.02317e-02 ± 5.86839e-04
  CSA_P2  : -6.93822e-05 ± 8.93686e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [22, 54, 72, 91, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [7, 37, 53, 80, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2868', '1.800', '0.1432', '1.800', '0.0962', '7.000', '0.7089', 1, 1, 1, 1, 1724754726.6532671]
VI_after__Init : ['1.201', '0.2871', '1.800', '0.1432', '1.799', '0.0886', '7.000', '0.7079', 1, 1, 1, 1, 1724754734.9576676]
VI_at__the_End : ['1.201', '0.4207', '1.800', '0.1315', '1.800', '0.1200', '7.000', '0.7085', 1, 1, 1, 1, 1724754798.6870246]