TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_30_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-013-07 | FUSED_ID : 6359364768387576023
  IC_TEMP :  -79.33 | VDDM : 1115.05 | AUX_INT :  -10.25 | CsaBias :   42.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55560e-03 / 2
  ADC_P0  : -1.02537e-02 ± 2.66986e-02
  ADC_P1  : 8.84037e-03 ± 6.78005e-04
  ADC_P2  : -6.79124e-06 ± 3.43503e-06
  CSA_Chi2/NDF : 1.92387e-04 / 2
  CSA_P0  : 5.66762e-02 ± 9.25146e-03
  CSA_P1  : 1.01665e-02 ± 6.97031e-04
  CSA_P2  : -6.57021e-05 ± 1.06150e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [27, 41, 68, 75, 77, 79, 105, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [0, 38, 48, 57, 74, 83, 102, 112, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3825', '1.800', '0.1225', '1.799', '0.0970', '7.000', '0.7078', 1, 1, 1, 1, 1724754630.41233]
VI_after__Init : ['1.201', '0.3840', '1.800', '0.1226', '1.800', '0.0910', '7.000', '0.7076', 1, 1, 1, 1, 1724754639.2297297]
VI_at__the_End : ['1.201', '0.4305', '1.800', '0.1320', '1.800', '0.1180', '7.000', '0.7086', 1, 1, 1, 1, 1724754706.4298153]