TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_28_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-014-07 | FUSED_ID : 6359364768387576039
  IC_TEMP :  -80.22 | VDDM : 1126.14 | AUX_INT :   -8.25 | CsaBias :   34.37
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30088e-03 / 2
  ADC_P0  : -8.25387e-03 ± 2.44476e-02
  ADC_P1  : 8.55435e-03 ± 6.14021e-04
  ADC_P2  : -6.01049e-06 ± 3.05603e-06
  CSA_Chi2/NDF : 1.77080e-04 / 2
  CSA_P0  : 5.45968e-02 ± 8.87578e-03
  CSA_P1  : 9.76226e-03 ± 6.68726e-04
  CSA_P2  : -5.98284e-05 ± 1.01839e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  11
 | N_BROKEN_FAST :  [15, 40, 62, 77, 81, 87, 113, 116, 117, 125, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [37, 83]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1938', '1.800', '0.1620', '1.800', '0.0924', '7.000', '0.7078', 1, 1, 1, 1, 1724754534.547254]
VI_after__Init : ['1.201', '0.1939', '1.800', '0.1620', '1.800', '0.0866', '7.000', '0.7079', 1, 1, 1, 1, 1724754542.740644]
VI_at__the_End : ['1.201', '0.4267', '1.800', '0.1302', '1.799', '0.1187', '7.000', '0.7083', 1, 1, 1, 1, 1724754609.4047544]