TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_27_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-015-07 | FUSED_ID : 6359364768387576055
  IC_TEMP :  -81.56 | VDDM : 1121.68 | AUX_INT :  -11.15 | CsaBias :   52.34
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.05235e-03 / 2
  ADC_P0  : -1.11545e-02 ± 3.07507e-02
  ADC_P1  : 9.11892e-03 ± 8.08545e-04
  ADC_P2  : -6.97148e-06 ± 4.24766e-06
  CSA_Chi2/NDF : 1.79774e-04 / 2
  CSA_P0  : 5.64513e-02 ± 8.94305e-03
  CSA_P1  : 1.01632e-02 ± 6.73794e-04
  CSA_P2  : -6.67025e-05 ± 1.02611e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [33, 122, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [16, 19, 30, 35, 64, 81, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3189', '1.800', '0.1614', '1.800', '0.0947', '7.000', '0.7086', 1, 1, 1, 1, 1724754438.2290294]
VI_after__Init : ['1.201', '0.3194', '1.800', '0.1611', '1.800', '0.0870', '7.000', '0.7079', 1, 1, 1, 1, 1724754446.4134674]
VI_at__the_End : ['1.201', '0.4301', '1.800', '0.1304', '1.800', '0.1160', '7.000', '0.7084', 1, 1, 1, 1, 1724754513.6617613]