TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_25_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-016-00 | FUSED_ID : 6359364768387576064
  IC_TEMP :  -86.76 | VDDM : 1115.14 | AUX_INT :  -12.47 | CsaBias :   60.66
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.50197e-03 / 2
  ADC_P0  : -1.24723e-02 ± 3.40015e-02
  ADC_P1  : 9.19457e-03 ± 9.03589e-04
  ADC_P2  : -6.64171e-06 ± 4.82943e-06
  CSA_Chi2/NDF : 1.49467e-04 / 2
  CSA_P0  : 6.06646e-02 ± 8.15445e-03
  CSA_P1  : 1.03591e-02 ± 6.14379e-04
  CSA_P2  : -7.14580e-05 ± 9.35626e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [17, 75, 77, 93]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [16, 23, 43, 47, 51, 75, 106, 112, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3090', '1.800', '0.1653', '1.800', '0.0987', '7.000', '0.7076', 1, 1, 1, 1, 1724754342.565589]
VI_after__Init : ['1.201', '0.3104', '1.800', '0.1655', '1.800', '0.0929', '7.000', '0.7077', 1, 1, 1, 1, 1724754351.413031]
VI_at__the_End : ['1.201', '0.4270', '1.800', '0.1363', '1.800', '0.1203', '7.000', '0.7084', 1, 1, 1, 1, 1724754419.4792535]