TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_24_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-017-00 | FUSED_ID : 6359364768387576080
  IC_TEMP :  -89.94 | VDDM : 1115.79 | AUX_INT :   -9.74 | CsaBias :   45.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.61359e-03 / 2
  ADC_P0  : -9.73909e-03 ± 2.73077e-02
  ADC_P1  : 9.28990e-03 ± 7.58447e-04
  ADC_P2  : -5.78139e-06 ± 4.21980e-06
  CSA_Chi2/NDF : 1.20745e-04 / 2
  CSA_P0  : 5.93793e-02 ± 7.32920e-03
  CSA_P1  : 1.04650e-02 ± 5.52202e-04
  CSA_P2  : -7.47688e-05 ± 8.40938e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [35, 38, 41, 48, 58, 75, 81, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [1, 9, 12, 25, 45, 65, 103]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3987', '1.800', '0.1325', '1.800', '0.0993', '7.000', '0.7076', 1, 1, 1, 1, 1724754246.650322]
VI_after__Init : ['1.201', '0.4001', '1.800', '0.1336', '1.800', '0.0936', '7.000', '0.7077', 1, 1, 1, 1, 1724754254.7096097]
VI_at__the_End : ['1.201', '0.4183', '1.800', '0.1340', '1.800', '0.1223', '7.000', '0.7085', 1, 1, 1, 1, 1724754323.174921]