TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_22_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-018-00 | FUSED_ID : 6359364768387576096
  IC_TEMP :  -91.27 | VDDM : 1115.07 | AUX_INT :  -11.58 | CsaBias :   51.78
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.10042e-03 / 2
  ADC_P0  : -1.15847e-02 ± 3.11293e-02
  ADC_P1  : 9.09664e-03 ± 8.24171e-04
  ADC_P2  : -6.37133e-06 ± 4.38265e-06
  CSA_Chi2/NDF : 1.00612e-04 / 2
  CSA_P0  : 5.68853e-02 ± 6.69032e-03
  CSA_P1  : 1.01389e-02 ± 5.04067e-04
  CSA_P2  : -7.20250e-05 ± 7.67634e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [2, 22, 38, 53, 54, 81, 93, 102, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [25, 53, 92, 103, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2207', '1.800', '0.1356', '1.800', '0.0953', '7.000', '0.7076', 1, 1, 1, 1, 1724754150.4219148]
VI_after__Init : ['1.201', '0.2209', '1.800', '0.1356', '1.800', '0.0893', '7.000', '0.7077', 1, 1, 1, 1, 1724754158.728116]
VI_at__the_End : ['1.201', '0.4068', '1.800', '0.1298', '1.800', '0.1219', '7.000', '0.7083', 1, 1, 1, 1, 1724754225.9588025]