TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_19_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-003-020-00 | FUSED_ID : 6359364768387576128
  IC_TEMP :  -87.14 | VDDM : 1119.70 | AUX_INT :  -10.90 | CsaBias :   44.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85410e-03 / 2
  ADC_P0  : -1.09020e-02 ± 2.91924e-02
  ADC_P1  : 9.26990e-03 ± 7.77322e-04
  ADC_P2  : -7.42567e-06 ± 4.13191e-06
  CSA_Chi2/NDF : 1.45650e-04 / 2
  CSA_P0  : 6.00581e-02 ± 8.04967e-03
  CSA_P1  : 1.04717e-02 ± 6.06484e-04
  CSA_P2  : -6.98656e-05 ± 9.23604e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 19, 30, 99, 120, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [52, 60, 69, 91, 102, 103, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2848', '1.800', '0.1752', '1.800', '0.0937', '7.000', '0.7072', 1, 1, 1, 1, 1724753957.9409404]
VI_after__Init : ['1.201', '0.2838', '1.800', '0.1756', '1.800', '0.0877', '7.000', '0.7072', 1, 1, 1, 1, 1724753966.296159]
VI_at__the_End : ['1.201', '0.4385', '1.800', '0.1364', '1.800', '0.1198', '7.000', '0.7083', 1, 1, 1, 1, 1724754026.4485562]