TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_43_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-004-007-15 | FUSED_ID : 6359364768387580031
  IC_TEMP :  -84.27 | VDDM : 1112.72 | AUX_INT :  -12.47 | CsaBias :   66.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.44317e-03 / 2
  ADC_P0  : -1.24731e-02 ± 3.35612e-02
  ADC_P1  : 8.86751e-03 ± 8.50903e-04
  ADC_P2  : -6.64528e-06 ± 4.32905e-06
  CSA_Chi2/NDF : 1.45036e-04 / 2
  CSA_P0  : 5.84180e-02 ± 8.03267e-03
  CSA_P1  : 1.02010e-02 ± 6.05204e-04
  CSA_P2  : -6.64825e-05 ± 9.21654e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 53, 68, 93, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [25, 26, 94, 111, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2305', '1.800', '0.1439', '1.800', '0.0885', '7.000', '0.7077', 1, 1, 1, 1, 1724755397.3050613]
VI_after__Init : ['1.202', '0.2306', '1.800', '0.1439', '1.799', '0.0826', '7.000', '0.7078', 1, 1, 1, 1, 1724755405.4444888]
VI_at__the_End : ['1.201', '0.4332', '1.800', '0.1349', '1.800', '0.1181', '7.000', '0.7087', 1, 1, 1, 1, 1724755471.49933]