TEST_NAME : Wafer
TEST_DATE : 24_08_27-12_57_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-004-016-08 | FUSED_ID : 6359364768387580168
  IC_TEMP :  -71.42 | VDDM : 1125.60 | AUX_INT :   -9.20 | CsaBias :   58.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.53045e-03 / 2
  ADC_P0  : -9.19848e-03 ± 2.65278e-02
  ADC_P1  : 8.47607e-03 ± 6.54780e-04
  ADC_P2  : -6.07175e-06 ± 3.20794e-06
  CSA_Chi2/NDF : 1.87200e-04 / 2
  CSA_P0  : 5.66140e-02 ± 9.12588e-03
  CSA_P1  : 1.01981e-02 ± 6.87570e-04
  CSA_P2  : -6.09660e-05 ± 1.04709e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [0, 28, 30, 32, 50, 57, 78, 95, 107]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [36, 50, 72, 79, 84, 107, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3837', '1.800', '0.1646', '1.800', '0.0981', '7.000', '0.7077', 1, 1, 1, 1, 1724756254.0505126]
VI_after__Init : ['1.201', '0.3842', '1.800', '0.1651', '1.800', '0.0930', '7.000', '0.7076', 1, 1, 1, 1, 1724756262.1067593]
VI_at__the_End : ['1.201', '0.4505', '1.800', '0.1325', '1.800', '0.1168', '7.000', '0.7086', 1, 1, 1, 1, 1724756321.2544107]