TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_00_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-004-018-08 | FUSED_ID : 6359364768387580200
  IC_TEMP :  -71.70 | VDDM : 1119.51 | AUX_INT :  -20.51 | CsaBias :   51.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.37463e-03 / 2
  ADC_P0  : -2.05096e-02 ± 3.37408e-02
  ADC_P1  : 9.02996e-03 ± 8.65318e-04
  ADC_P2  : -7.05412e-06 ± 4.42278e-06
  CSA_Chi2/NDF : 1.75985e-04 / 2
  CSA_P0  : 5.76070e-02 ± 8.84832e-03
  CSA_P1  : 9.92821e-03 ± 6.66657e-04
  CSA_P2  : -5.85887e-05 ± 1.01524e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [2, 73, 84, 92, 105, 106, 116, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [11, 27, 57, 60, 66, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1317', '1.800', '0.1432', '1.800', '0.0847', '7.000', '0.7078', 1, 1, 1, 1, 1724756446.6653783]
VI_after__Init : ['1.201', '0.1317', '1.800', '0.1433', '1.800', '0.0790', '7.000', '0.7076', 1, 1, 1, 1, 1724756454.6648488]
VI_at__the_End : ['1.201', '0.4438', '1.800', '0.1347', '1.800', '0.1191', '7.000', '0.7083', 1, 1, 1, 1, 1724756523.3098962]