TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_03_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-004-020-08 | FUSED_ID : 6359364768387580232
  IC_TEMP :  -79.07 | VDDM : 1117.78 | AUX_INT :   -9.08 | CsaBias :   69.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35181e-03 / 2
  ADC_P0  : -9.08398e-03 ± 2.49274e-02
  ADC_P1  : 8.74003e-03 ± 6.40282e-04
  ADC_P2  : -6.01286e-06 ± 3.27618e-06
  CSA_Chi2/NDF : 1.85705e-04 / 2
  CSA_P0  : 5.79172e-02 ± 9.08937e-03
  CSA_P1  : 1.02653e-02 ± 6.84819e-04
  CSA_P2  : -6.50433e-05 ± 1.04290e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [16, 20, 34, 66, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [48, 60, 74, 79, 96, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2375', '1.799', '0.1641', '1.800', '0.0978', '7.000', '0.7077', 1, 1, 1, 1, 1724756638.2114837]
VI_after__Init : ['1.201', '0.2376', '1.800', '0.1643', '1.800', '0.0919', '7.000', '0.7075', 1, 1, 1, 1, 1724756646.3968916]
VI_at__the_End : ['1.201', '0.4443', '1.800', '0.1324', '1.800', '0.1195', '7.000', '0.7081', 1, 1, 1, 1, 1724756715.940691]