TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_05_34
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-004-021-08 | FUSED_ID : 6359364768387580248
  IC_TEMP :  -76.68 | VDDM : 1103.27 | AUX_INT :  -11.88 | CsaBias :   50.98
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.21284e-03 / 2
  ADC_P0  : -1.18845e-02 ± 3.18825e-02
  ADC_P1  : 9.03414e-03 ± 8.12882e-04
  ADC_P2  : -7.63408e-06 ± 4.13418e-06
  CSA_Chi2/NDF : 1.62020e-04 / 2
  CSA_P0  : 5.82028e-02 ± 8.48998e-03
  CSA_P1  : 1.02873e-02 ± 6.39659e-04
  CSA_P2  : -6.43318e-05 ± 9.74124e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [64, 71, 85, 96, 107, 110]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [16, 23, 46, 58, 88, 91, 93, 98]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2866', '1.800', '0.1224', '1.800', '0.0935', '7.000', '0.7076', 1, 1, 1, 1, 1724756734.1374614]
VI_after__Init : ['1.201', '0.2869', '1.800', '0.1225', '1.799', '0.0878', '7.000', '0.7075', 1, 1, 1, 1, 1724756742.971714]
VI_at__the_End : ['1.201', '0.4476', '1.800', '0.1338', '1.801', '0.1181', '7.000', '0.7081', 1, 1, 1, 1, 1724756810.5496988]