TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_08_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-004-023-08 | FUSED_ID : 6359364768387580280
  IC_TEMP :  -77.42 | VDDM : 1120.66 | AUX_INT :   -9.83 | CsaBias :   45.31
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.76567e-03 / 2
  ADC_P0  : -9.82781e-03 ± 2.84921e-02
  ADC_P1  : 9.23412e-03 ± 7.57921e-04
  ADC_P2  : -7.55176e-06 ± 4.00064e-06
  CSA_Chi2/NDF : 1.82790e-04 / 2
  CSA_P0  : 5.70687e-02 ± 9.01775e-03
  CSA_P1  : 1.02082e-02 ± 6.79423e-04
  CSA_P2  : -6.37286e-05 ± 1.03468e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [11, 29, 72, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [7, 26, 52, 71, 82, 88, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2417', '1.800', '0.1377', '1.800', '0.0977', '7.000', '0.7075', 1, 1, 1, 1, 1724756926.3871593]
VI_after__Init : ['1.201', '0.2421', '1.800', '0.1377', '1.800', '0.0918', '7.000', '0.7075', 1, 1, 1, 1, 1724756934.5524893]
VI_at__the_End : ['1.201', '0.4421', '1.800', '0.1321', '1.800', '0.1184', '7.000', '0.7084', 1, 1, 1, 1, 1724756993.4270809]