TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_42_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-005-02 | FUSED_ID : 6359364768387584082
  IC_TEMP :  -72.88 | VDDM : 1119.06 | AUX_INT :  -10.30 | CsaBias :   58.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.85896e-03 / 2
  ADC_P0  : -1.03014e-02 ± 2.92881e-02
  ADC_P1  : 8.69626e-03 ± 7.45792e-04
  ADC_P2  : -5.92669e-06 ± 3.79130e-06
  CSA_Chi2/NDF : 2.03330e-04 / 2
  CSA_P0  : 5.56194e-02 ± 9.51094e-03
  CSA_P1  : 1.03375e-02 ± 7.16581e-04
  CSA_P2  : -6.30300e-05 ± 1.09127e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [6, 26, 98]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [53, 87, 96, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1894', '1.800', '0.1953', '1.800', '0.0887', '7.000', '0.7069', 1, 1, 1, 1, 1724758933.245241]
VI_after__Init : ['1.201', '0.1897', '1.800', '0.1951', '1.800', '0.0828', '7.000', '0.7071', 1, 1, 1, 1, 1724758941.2916498]
VI_at__the_End : ['1.201', '0.4495', '1.800', '0.1358', '1.799', '0.1177', '7.000', '0.7077', 1, 1, 1, 1, 1724759001.0048234]