TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_37_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-008-02 | FUSED_ID : 6359364768387584130
  IC_TEMP :  -74.34 | VDDM : 1115.46 | AUX_INT :  -10.48 | CsaBias :   60.04
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.71953e-03 / 2
  ADC_P0  : -1.04824e-02 ± 2.81140e-02
  ADC_P1  : 8.86758e-03 ± 7.20605e-04
  ADC_P2  : -6.60851e-06 ± 3.68684e-06
  CSA_Chi2/NDF : 1.81188e-04 / 2
  CSA_P0  : 5.83510e-02 ± 8.97816e-03
  CSA_P1  : 1.03474e-02 ± 6.76439e-04
  CSA_P2  : -6.68332e-05 ± 1.03014e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [35, 56, 59, 60, 78, 83, 87, 102, 108, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [5, 51]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3473', '1.800', '0.1421', '1.800', '0.0985', '7.000', '0.7070', 1, 1, 1, 1, 1724758645.3722327]
VI_after__Init : ['1.201', '0.3477', '1.800', '0.1421', '1.799', '0.0926', '7.000', '0.7071', 1, 1, 1, 1, 1724758653.4245603]
VI_at__the_End : ['1.201', '0.4433', '1.800', '0.1356', '1.800', '0.1150', '7.000', '0.7078', 1, 1, 1, 1, 1724758721.4061246]