TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_31_03
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-012-02 | FUSED_ID : 6359364768387584194
  IC_TEMP :  -70.76 | VDDM : 1119.28 | AUX_INT :   -9.26 | CsaBias :   66.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.34050e-03 / 2
  ADC_P0  : -9.26161e-03 ± 2.48049e-02
  ADC_P1  : 8.42352e-03 ± 6.10772e-04
  ADC_P2  : -5.70069e-06 ± 2.99793e-06
  CSA_Chi2/NDF : 1.79566e-04 / 2
  CSA_P0  : 5.73411e-02 ± 8.93787e-03
  CSA_P1  : 1.01109e-02 ± 6.73404e-04
  CSA_P2  : -6.01278e-05 ± 1.02551e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [19, 25, 91]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [6, 9, 23, 25, 47, 49, 58, 62, 73, 77, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3670', '1.800', '0.1631', '1.799', '0.0964', '7.000', '0.7072', 1, 1, 1, 1, 1724758262.466958]
VI_after__Init : ['1.201', '0.3677', '1.800', '0.1633', '1.800', '0.0905', '7.000', '0.7072', 1, 1, 1, 1, 1724758271.21726]
VI_at__the_End : ['1.198', '0.4515', '1.800', '0.1321', '1.800', '0.1172', '7.000', '0.7082', 1, 1, 1, 1, 1724758339.297]