TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_23_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-017-05 | FUSED_ID : 6359364768387584277
  IC_TEMP :  -70.42 | VDDM : 1118.50 | AUX_INT :  -10.22 | CsaBias :   52.83
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.76022e-03 / 2
  ADC_P0  : -1.02161e-02 ± 2.84462e-02
  ADC_P1  : 9.05635e-03 ± 7.42648e-04
  ADC_P2  : -7.10076e-06 ± 3.85890e-06
  CSA_Chi2/NDF : 1.53966e-04 / 2
  CSA_P0  : 5.86813e-02 ± 8.27628e-03
  CSA_P1  : 1.00146e-02 ± 6.23558e-04
  CSA_P2  : -6.10790e-05 ± 9.49605e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [17, 44, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 15, 29, 40, 63, 80, 90, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3764', '1.800', '0.1633', '1.800', '0.0969', '7.000', '0.7070', 1, 1, 1, 1, 1724757789.1699848]
VI_after__Init : ['1.202', '0.3770', '1.800', '0.1638', '1.800', '0.0911', '7.000', '0.7072', 1, 1, 1, 1, 1724757797.9023132]
VI_at__the_End : ['1.201', '0.4428', '1.800', '0.1370', '1.801', '0.1152', '7.000', '0.7077', 1, 1, 1, 1, 1724757856.7677877]