TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_16_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-005-021-05 | FUSED_ID : 6359364768387584341
  IC_TEMP :  -77.89 | VDDM : 1119.96 | AUX_INT :   -9.76 | CsaBias :   61.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.51836e-03 / 2
  ADC_P0  : -9.76326e-03 ± 2.63688e-02
  ADC_P1  : 9.02756e-03 ± 6.79703e-04
  ADC_P2  : -7.54762e-06 ± 3.47645e-06
  CSA_Chi2/NDF : 1.70247e-04 / 2
  CSA_P0  : 5.87369e-02 ± 8.70286e-03
  CSA_P1  : 9.64671e-03 ± 6.55698e-04
  CSA_P2  : -5.61778e-05 ± 9.98550e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [2, 34, 43, 60, 65, 75, 76, 84, 89]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [0, 1, 33, 43, 83, 102]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2109', '1.800', '0.1416', '1.800', '0.0944', '7.000', '0.7084', 1, 1, 1, 1, 1724757405.25214]
VI_after__Init : ['1.201', '0.2108', '1.800', '0.1418', '1.800', '0.0872', '7.000', '0.7074', 1, 1, 1, 1, 1724757413.438494]
VI_at__the_End : ['1.201', '0.4389', '1.799', '0.1330', '1.800', '0.1215', '7.000', '0.7080', 1, 1, 1, 1, 1724757477.3885753]