TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_20_01
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-004-12 | FUSED_ID : 6359364768387588172
  IC_TEMP :  -85.43 | VDDM : 1108.68 | AUX_INT :  -13.32 | CsaBias :   50.21
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.84138e-03 / 2
  ADC_P0  : -1.33224e-02 ± 3.62471e-02
  ADC_P1  : 9.12339e-03 ± 9.45709e-04
  ADC_P2  : -6.81444e-06 ± 4.96952e-06
  CSA_Chi2/NDF : 1.51323e-04 / 2
  CSA_P0  : 5.94440e-02 ± 8.20494e-03
  CSA_P1  : 1.08275e-02 ± 6.18183e-04
  CSA_P2  : -7.56248e-05 ± 9.41419e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [48, 88, 96, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [2, 15, 58, 75, 85, 88, 89, 118]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1901', '1.800', '0.1486', '1.800', '0.0880', '7.000', '0.7073', 1, 1, 1, 1, 1724764801.3375933]
VI_after__Init : ['1.202', '0.1906', '1.800', '0.1488', '1.800', '0.0824', '7.000', '0.7070', 1, 1, 1, 1, 1724764809.5528371]
VI_at__the_End : ['1.202', '0.4337', '1.800', '0.1356', '1.800', '0.1172', '7.000', '0.7079', 1, 1, 1, 1, 1724764873.231008]