TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_21_37
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-005-12 | FUSED_ID : 6359364768387588188
  IC_TEMP :  -94.46 | VDDM : 1118.48 | AUX_INT :  -11.11 | CsaBias :   34.10
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.21060e-03 / 2
  ADC_P0  : -1.11124e-02 ± 3.20107e-02
  ADC_P1  : 9.07009e-03 ± 8.60864e-04
  ADC_P2  : -5.61940e-06 ± 4.64949e-06
  CSA_Chi2/NDF : 9.48445e-05 / 2
  CSA_P0  : 5.86873e-02 ± 6.49574e-03
  CSA_P1  : 1.09511e-02 ± 4.89407e-04
  CSA_P2  : -8.24650e-05 ± 7.45309e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [15, 24, 33, 48, 50, 85]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [36, 38, 40, 97, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3065', '1.799', '0.1482', '1.800', '0.0957', '7.000', '0.7073', 1, 1, 1, 1, 1724764897.4061263]
VI_after__Init : ['1.202', '0.3069', '1.800', '0.1491', '1.800', '0.0900', '7.000', '0.7073', 1, 1, 1, 1, 1724764905.496584]
VI_at__the_End : ['1.201', '0.4180', '1.800', '0.1351', '1.800', '0.1211', '7.000', '0.7082', 1, 1, 1, 1, 1724764963.1900768]