TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_23_13
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-006-12 | FUSED_ID : 6359364768387588204
  IC_TEMP : -117.55 | VDDM : 1108.55 | AUX_INT :  -15.66 | CsaBias :   22.67
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.62808e-03 / 2
  ADC_P0  : -1.56613e-02 ± 4.09249e-02
  ADC_P1  : 9.61593e-03 ± 1.10679e-03
  ADC_P2  : -8.32729e-06 ± 6.06028e-06
  CSA_Chi2/NDF : 8.56709e-05 / 2
  CSA_P0  : 5.60371e-02 ± 6.17361e-03
  CSA_P1  : 1.03322e-02 ± 4.65137e-04
  CSA_P2  : -8.26438e-05 ± 7.08348e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [41, 117]
 | N_BROKEN_SLOW :  [113]
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [12, 15, 26, 45, 50, 53, 78, 79, 90, 92, 106]
 | P_BROKEN_SLOW :  [113]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3323', '1.800', '0.1386', '1.800', '0.0978', '7.000', '0.7073', 1, 1, 1, 1, 1724764992.8627455]
VI_after__Init : ['1.202', '0.3371', '1.800', '0.1396', '1.799', '0.0916', '7.000', '0.7075', 1, 1, 1, 1, 1724765001.0650754]
VI_at__the_End : ['1.201', '0.3776', '1.800', '0.1300', '1.800', '0.1163', '7.000', '0.7079', 1, 1, 1, 1, 1724765065.0151224]