TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_54_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-009-12 | FUSED_ID : 6359364768387588252
  IC_TEMP :  -70.17 | VDDM : 1128.70 | AUX_INT :  -10.99 | CsaBias :   58.44
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.94886e-03 / 2
  ADC_P0  : -1.09947e-02 ± 2.99744e-02
  ADC_P1  : 8.72752e-03 ± 7.61532e-04
  ADC_P2  : -5.98337e-06 ± 3.87490e-06
  CSA_Chi2/NDF : 1.74304e-04 / 2
  CSA_P0  : 5.89809e-02 ± 8.80594e-03
  CSA_P1  : 1.04366e-02 ± 6.63464e-04
  CSA_P2  : -6.34473e-05 ± 1.01038e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [17, 24, 35, 38, 72]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [10, 12, 16, 85, 88, 99, 114, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3279', '1.800', '0.1551', '1.800', '0.0933', '7.000', '0.7071', 1, 1, 1, 1, 1724759693.572803]
VI_after__Init : ['1.201', '0.3282', '1.800', '0.1551', '1.800', '0.0879', '7.000', '0.7069', 1, 1, 1, 1, 1724759702.2931106]
VI_at__the_End : ['1.201', '0.4601', '1.800', '0.1381', '1.803', '0.1166', '7.000', '0.7076', 1, 1, 1, 1, 1724759761.0635135]