TEST_NAME : Wafer
TEST_DATE : 24_08_27-13_56_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-010-12 | FUSED_ID : 6359364768387588268
  IC_TEMP :  -70.60 | VDDM : 1123.51 | AUX_INT :   -8.56 | CsaBias :   59.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.17210e-03 / 2
  ADC_P0  : -8.56085e-03 ± 2.31523e-02
  ADC_P1  : 8.57016e-03 ± 5.73134e-04
  ADC_P2  : -6.52599e-06 ± 2.81232e-06
  CSA_Chi2/NDF : 1.83171e-04 / 2
  CSA_P0  : 5.86778e-02 ± 9.02716e-03
  CSA_P1  : 1.01826e-02 ± 6.80131e-04
  CSA_P2  : -6.03499e-05 ± 1.03576e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [29, 36, 38, 70, 79, 88, 91, 95, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [0, 3, 25, 52, 70, 75, 91, 92, 103, 104, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3259', '1.800', '0.1253', '1.800', '0.0952', '7.000', '0.7077', 1, 1, 1, 1, 1724759790.3253071]
VI_after__Init : ['1.201', '0.3260', '1.800', '0.1255', '1.800', '0.0874', '7.000', '0.7069', 1, 1, 1, 1, 1724759798.4116693]
VI_at__the_End : ['1.201', '0.4560', '1.800', '0.1321', '1.799', '0.1177', '7.000', '0.7075', 1, 1, 1, 1, 1724759861.410671]