TEST_NAME : Wafer
TEST_DATE : 24_08_27-14_09_17
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-018-11 | FUSED_ID : 6359364768387588395
  IC_TEMP :  -62.83 | VDDM : 1125.80 | AUX_INT :   -9.90 | CsaBias :   66.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55944e-03 / 2
  ADC_P0  : -9.89908e-03 ± 2.67742e-02
  ADC_P1  : 8.50951e-03 ± 6.61530e-04
  ADC_P2  : -5.95546e-06 ± 3.26229e-06
  CSA_Chi2/NDF : 1.59226e-04 / 2
  CSA_P0  : 5.66788e-02 ± 8.41645e-03
  CSA_P1  : 1.02119e-02 ± 6.34118e-04
  CSA_P2  : -5.72607e-05 ± 9.65687e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [15, 17, 30, 116, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [12, 14, 96, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2057', '1.800', '0.1621', '1.800', '0.0842', '7.000', '0.7066', 1, 1, 1, 1, 1724760557.312659]
VI_after__Init : ['1.201', '0.2057', '1.800', '0.1620', '1.800', '0.0787', '7.000', '0.7068', 1, 1, 1, 1, 1724760565.3471618]
VI_at__the_End : ['1.201', '0.4676', '1.800', '0.1375', '1.800', '0.1135', '7.000', '0.7071', 1, 1, 1, 1, 1724760633.3807764]