TEST_NAME : Wafer
TEST_DATE : 24_08_27-14_10_53
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-019-11 | FUSED_ID : 6359364768387588411
  IC_TEMP :  -73.18 | VDDM : 1116.30 | AUX_INT :  -11.46 | CsaBias :   67.16
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.06467e-03 / 2
  ADC_P0  : -1.14570e-02 ± 3.08188e-02
  ADC_P1  : 8.79489e-03 ± 7.76028e-04
  ADC_P2  : -6.68933e-06 ± 3.90643e-06
  CSA_Chi2/NDF : 1.32849e-04 / 2
  CSA_P0  : 6.05602e-02 ± 7.68778e-03
  CSA_P1  : 1.00599e-02 ± 5.79219e-04
  CSA_P2  : -6.08655e-05 ± 8.82081e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [50, 70, 88, 91, 93, 122]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [26, 29, 100, 101]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2001', '1.800', '0.1676', '1.800', '0.0882', '7.000', '0.7065', 1, 1, 1, 1, 1724760652.9562523]
VI_after__Init : ['1.201', '0.2002', '1.800', '0.1677', '1.800', '0.0828', '7.000', '0.7065', 1, 1, 1, 1, 1724760661.8585112]
VI_at__the_End : ['1.201', '0.4487', '1.800', '0.1353', '1.800', '0.1181', '7.000', '0.7072', 1, 1, 1, 1, 1724760720.2638571]