TEST_NAME : Wafer
TEST_DATE : 24_08_27-14_12_29
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-020-11 | FUSED_ID : 6359364768387588427
  IC_TEMP :  -66.70 | VDDM : 1125.91 | AUX_INT :   -9.02 | CsaBias :   57.75
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.40944e-03 / 2
  ADC_P0  : -9.01556e-03 ± 2.55001e-02
  ADC_P1  : 8.38409e-03 ± 6.39189e-04
  ADC_P2  : -4.83558e-06 ± 3.20080e-06
  CSA_Chi2/NDF : 1.67627e-04 / 2
  CSA_P0  : 5.86699e-02 ± 8.63565e-03
  CSA_P1  : 1.06735e-02 ± 6.50634e-04
  CSA_P2  : -6.71568e-05 ± 9.90838e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [39, 60]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [9, 18, 45, 66, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2690', '1.800', '0.1453', '1.800', '0.0894', '7.000', '0.7067', 1, 1, 1, 1, 1724760748.7656922]
VI_after__Init : ['1.202', '0.2684', '1.800', '0.1453', '1.800', '0.0835', '7.000', '0.7067', 1, 1, 1, 1, 1724760756.7190657]
VI_at__the_End : ['1.201', '0.4600', '1.800', '0.1359', '1.801', '0.1147', '7.000', '0.7072', 1, 1, 1, 1, 1724760823.3339214]