TEST_NAME : Wafer
TEST_DATE : 24_08_27-14_14_04
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-021-11 | FUSED_ID : 6359364768387588443
  IC_TEMP :  -70.50 | VDDM : 1120.50 | AUX_INT :  -11.75 | CsaBias :   66.82
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.10750e-03 / 2
  ADC_P0  : -1.17463e-02 ± 3.11468e-02
  ADC_P1  : 8.78787e-03 ± 7.86856e-04
  ADC_P2  : -6.42416e-06 ± 3.98392e-06
  CSA_Chi2/NDF : 1.45334e-04 / 2
  CSA_P0  : 5.73926e-02 ± 8.04091e-03
  CSA_P1  : 1.06151e-02 ± 6.05825e-04
  CSA_P2  : -6.88694e-05 ± 9.22600e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [64, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [7, 29, 39, 45, 71]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2256', '1.800', '0.1571', '1.800', '0.0851', '7.000', '0.7067', 1, 1, 1, 1, 1724760844.269312]
VI_after__Init : ['1.202', '0.2258', '1.800', '0.1571', '1.800', '0.0794', '7.000', '0.7066', 1, 1, 1, 1, 1724760852.4076605]
VI_at__the_End : ['1.202', '0.4506', '1.800', '0.1353', '1.800', '0.1180', '7.000', '0.7076', 1, 1, 1, 1, 1724760920.3853033]