TEST_NAME : Wafer
TEST_DATE : 24_08_27-14_15_40
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-022-11 | FUSED_ID : 6359364768387588459
  IC_TEMP :  -69.01 | VDDM : 1115.04 | AUX_INT :  -41.44 | CsaBias :   33.25
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.75907e-03 / 2
  ADC_P0  : -4.14439e-02 ± 3.77303e-02
  ADC_P1  : 9.40535e-03 ± 9.53930e-04
  ADC_P2  : -8.53414e-06 ± 4.81096e-06
  CSA_Chi2/NDF : 1.90981e-04 / 2
  CSA_P0  : 5.80626e-02 ± 9.21760e-03
  CSA_P1  : 1.02711e-02 ± 6.94479e-04
  CSA_P2  : -6.13692e-05 ± 1.05761e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 8, 11, 45, 59]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [97, 101, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3637', '1.800', '0.1582', '1.800', '0.0982', '7.000', '0.7068', 1, 1, 1, 1, 1724760939.8278568]
VI_after__Init : ['1.202', '0.3642', '1.800', '0.1583', '1.800', '0.0924', '7.000', '0.7065', 1, 1, 1, 1, 1724760947.8131585]
VI_at__the_End : ['1.202', '0.4561', '1.800', '0.1392', '1.800', '0.1149', '7.000', '0.7077', 1, 1, 1, 1, 1724761015.5497935]