TEST_NAME : Wafer
TEST_DATE : 24_08_27-14_17_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-023-11 | FUSED_ID : 6359364768387588475
  IC_TEMP :  -58.54 | VDDM : 1118.24 | AUX_INT :  -66.06 | CsaBias :   17.80
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.68911e-03 / 2
  ADC_P0  : -6.60563e-02 ± 3.11923e-02
  ADC_P1  : 9.39637e-03 ± 7.66038e-04
  ADC_P2  : -8.79986e-06 ± 3.71498e-06
  CSA_Chi2/NDF : 1.66388e-04 / 2
  CSA_P0  : 5.54732e-02 ± 8.60366e-03
  CSA_P1  : 9.69109e-03 ± 6.48224e-04
  CSA_P2  : -4.90996e-05 ± 9.87168e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [15, 30, 35, 50, 58, 66, 125, 127]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [32, 35, 43, 107]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2421', '1.800', '0.1467', '1.800', '0.0892', '7.000', '0.7067', 1, 1, 1, 1, 1724761034.9773717]
VI_after__Init : ['1.201', '0.2422', '1.800', '0.1467', '1.800', '0.0835', '7.000', '0.7066', 1, 1, 1, 1, 1724761043.9057198]
VI_at__the_End : ['1.202', '0.4667', '1.800', '0.1321', '1.800', '0.1151', '7.000', '0.7075', 1, 1, 1, 1, 1724761109.1585944]