TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_33_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-006-024-11 | FUSED_ID : 6359364768387588491
  IC_TEMP : -114.96 | VDDM : 1114.61 | AUX_INT :  -14.75 | CsaBias :   31.89
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 3.12383e-03 / 2
  ADC_P0  : -1.47462e-02 ± 3.79162e-02
  ADC_P1  : 9.36685e-03 ± 9.93223e-04
  ADC_P2  : -7.81444e-06 ± 5.25683e-06
  CSA_Chi2/NDF : 6.58073e-05 / 2
  CSA_P0  : 5.96959e-02 ± 5.41078e-03
  CSA_P1  : 1.04852e-02 ± 4.07663e-04
  CSA_P2  : -8.50683e-05 ± 6.20822e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [63, 65, 79, 85]
 | N_BROKEN_SLOW :  
   P_BROKEN_DISC :  128
 | P_BROKEN_FAST :  
 | P_BROKEN_SLOW :  
ASIC_QA_category :  
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VI_before_Init : ['1.201', '0.1908', '1.800', '0.1449', '1.800', '0.0982', '7.000', '0.7075', 1, 1, 1, 1, 1724765632.0523536]
VI_after__Init : ['1.201', '0.1909', '1.800', '0.1450', '1.799', '0.0926', '7.000', '0.7074', 1, 1, 1, 1, 1724765640.6757789]
VI_at__the_End : ['1.201', '0.3810', '1.800', '0.1314', '1.806', '0.1254', '7.000', '0.7079', 1, 1, 1, 1, 1724765690.4520261]