TEST_NAME : Wafer
TEST_DATE : 24_08_27-16_09_15
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-007-007-01 | FUSED_ID : 6359364768387592305
  IC_TEMP :  -94.09 | VDDM : 1104.32 | AUX_INT :  -13.28 | CsaBias :   48.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.80930e-03 / 2
  ADC_P0  : -1.32767e-02 ± 3.60771e-02
  ADC_P1  : 8.85878e-03 ± 9.32672e-04
  ADC_P2  : -5.50889e-06 ± 4.87877e-06
  CSA_Chi2/NDF : 8.13355e-05 / 2
  CSA_P0  : 5.74184e-02 ± 6.01537e-03
  CSA_P1  : 1.04205e-02 ± 4.53215e-04
  CSA_P2  : -7.93785e-05 ± 6.90193e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [0, 8, 15, 17, 44, 52, 65, 68, 72, 85, 88, 93, 100, 109, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [12, 42, 70, 82, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2991', '1.800', '0.1548', '1.800', '0.1010', '7.000', '0.7076', 1, 1, 1, 1, 1724767754.5551014]
VI_after__Init : ['1.201', '0.3001', '1.800', '0.1556', '1.800', '0.0950', '7.000', '0.7075', 1, 1, 1, 1, 1724767762.636571]
VI_at__the_End : ['1.202', '0.3963', '1.800', '0.1349', '1.800', '0.1174', '7.000', '0.7083', 1, 1, 1, 1, 1724767812.9115345]