TEST_NAME : Wafer
TEST_DATE : 24_08_27-16_07_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-007-008-01 | FUSED_ID : 6359364768387592321
  IC_TEMP : -107.17 | VDDM : 1119.76 | AUX_INT :  -11.04 | CsaBias :   26.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.77613e-03 / 2
  ADC_P0  : -1.10421e-02 ± 2.85561e-02
  ADC_P1  : 9.40060e-03 ± 7.75619e-04
  ADC_P2  : -7.17768e-06 ± 4.22423e-06
  CSA_Chi2/NDF : 7.75054e-05 / 2
  CSA_P0  : 5.85966e-02 ± 5.87203e-03
  CSA_P1  : 1.05176e-02 ± 4.42415e-04
  CSA_P2  : -8.21502e-05 ± 6.73746e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [14, 31, 57, 89, 90, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 52, 80, 102, 119]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3117', '1.800', '0.1421', '1.800', '0.0947', '7.000', '0.7076', 1, 1, 1, 1, 1724767658.8131893]
VI_after__Init : ['1.202', '0.3138', '1.800', '0.1428', '1.800', '0.0888', '7.000', '0.7073', 1, 1, 1, 1, 1724767666.9245493]
VI_at__the_End : ['1.202', '0.3934', '1.800', '0.1327', '1.800', '0.1190', '7.000', '0.7083', 1, 1, 1, 1, 1724767719.0087433]