TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_53_22
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-007-017-06 | FUSED_ID : 6359364768387592470
  IC_TEMP :  -97.25 | VDDM : 1113.81 | AUX_INT :  -11.28 | CsaBias :   25.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.92409e-03 / 2
  ADC_P0  : -1.12782e-02 ± 2.97586e-02
  ADC_P1  : 9.24635e-03 ± 7.97950e-04
  ADC_P2  : -6.75823e-06 ± 4.29392e-06
  CSA_Chi2/NDF : 7.55235e-05 / 2
  CSA_P0  : 6.10178e-02 ± 5.79647e-03
  CSA_P1  : 1.05005e-02 ± 4.36722e-04
  CSA_P2  : -8.02146e-05 ± 6.65076e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  12
 | N_BROKEN_FAST :  [64, 94, 110, 114, 115, 119]
 | N_BROKEN_SLOW :  [5, 14, 33, 72, 115, 124]
   P_BROKEN_DISC :  79
 | P_BROKEN_FAST :  []
 | P_BROKEN_SLOW :  [1, 2, 4, 5, 6, 8, 9, 10, 11, 12, 13, 14, 15, 17, 18, 19, 21, 24, 25, 26, 27, 28, 30, 31, 32, 33, 34, 35, 36, 39, 42, 45, 46, 50, 53, 54, 57, 59, 60, 62, 63, 64, 66, 67, 69, 70, 71, 72, 75, 76, 78, 82, 83, 84, 85, 86, 88, 89, 91, 93, 94, 95, 97, 98, 99, 100, 102, 103, 105, 106, 107, 111, 113, 115, 117, 119, 121, 123, 127]
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2775', '1.800', '0.1732', '1.800', '0.0972', '7.000', '0.7074', 1, 1, 1, 1, 1724766801.8748071]
VI_after__Init : ['1.201', '0.2794', '1.800', '0.1747', '1.800', '0.0912', '7.000', '0.7075', 1, 1, 1, 1, 1724766810.0622528]
VI_at__the_End : ['1.201', '0.4012', '1.800', '0.1349', '1.799', '0.1209', '7.000', '0.7081', 1, 1, 1, 1, 1724766873.924642]