TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_51_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-007-018-06 | FUSED_ID : 6359364768387592486
  IC_TEMP : -100.09 | VDDM : 1106.88 | AUX_INT :  -12.44 | CsaBias :   34.26
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.19697e-03 / 2
  ADC_P0  : -1.24423e-02 ± 3.17366e-02
  ADC_P1  : 9.38108e-03 ± 8.37960e-04
  ADC_P2  : -8.07255e-06 ± 4.43473e-06
  CSA_Chi2/NDF : 8.74538e-05 / 2
  CSA_P0  : 5.92373e-02 ± 6.23752e-03
  CSA_P1  : 1.02696e-02 ± 4.69952e-04
  CSA_P2  : -7.61486e-05 ± 7.15681e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [7, 11, 17, 35, 40, 43, 61, 73, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 24, 26, 32, 57, 75, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2007', '1.800', '0.1487', '1.800', '0.1001', '7.000', '0.7074', 1, 1, 1, 1, 1724766705.3617563]
VI_after__Init : ['1.201', '0.2011', '1.800', '0.1496', '1.800', '0.0941', '7.000', '0.7076', 1, 1, 1, 1, 1724766714.1931016]
VI_at__the_End : ['1.187', '0.3949', '1.800', '0.1366', '1.800', '0.1244', '7.000', '0.7081', 1, 1, 1, 1, 1724766775.7827086]