TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_50_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-007-019-06 | FUSED_ID : 6359364768387592502
  IC_TEMP : -102.33 | VDDM : 1116.13 | AUX_INT :  -12.25 | CsaBias :   34.09
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.18571e-03 / 2
  ADC_P0  : -1.22501e-02 ± 3.17028e-02
  ADC_P1  : 9.30368e-03 ± 8.47939e-04
  ADC_P2  : -7.00241e-06 ± 4.56682e-06
  CSA_Chi2/NDF : 8.06762e-05 / 2
  CSA_P0  : 5.81692e-02 ± 5.99094e-03
  CSA_P1  : 1.02979e-02 ± 4.51374e-04
  CSA_P2  : -7.85396e-05 ± 6.87390e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [42, 52, 57, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [2, 26, 80, 84, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1656', '1.800', '0.1505', '1.800', '0.0935', '7.000', '0.7073', 1, 1, 1, 1, 1724766609.7684107]
VI_after__Init : ['1.201', '0.1660', '1.800', '0.1506', '1.800', '0.0876', '7.000', '0.7074', 1, 1, 1, 1, 1724766617.5209057]
VI_at__the_End : ['1.201', '0.3934', '1.800', '0.1312', '1.800', '0.1215', '7.000', '0.7080', 1, 1, 1, 1, 1724766681.358425]