TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_48_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-007-020-06 | FUSED_ID : 6359364768387592518
  IC_TEMP :  -92.13 | VDDM : 1111.99 | AUX_INT :  -10.89 | CsaBias :   45.64
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.90858e-03 / 2
  ADC_P0  : -1.08914e-02 ± 2.96300e-02
  ADC_P1  : 9.46849e-03 ± 8.07038e-04
  ADC_P2  : -7.71252e-06 ± 4.38666e-06
  CSA_Chi2/NDF : 1.18176e-04 / 2
  CSA_P0  : 6.00962e-02 ± 7.25081e-03
  CSA_P1  : 9.72237e-03 ± 5.46296e-04
  CSA_P2  : -6.50917e-05 ± 8.31945e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [9, 37, 65, 76, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 25, 66, 69, 107, 117, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1889', '1.800', '0.1685', '1.799', '0.0923', '7.000', '0.7075', 1, 1, 1, 1, 1724766512.843529]
VI_after__Init : ['1.200', '0.1890', '1.800', '0.1687', '1.802', '0.0866', '7.000', '0.7074', 1, 1, 1, 1, 1724766521.4877946]
VI_at__the_End : ['1.201', '0.4088', '1.800', '0.1374', '1.800', '0.1195', '7.000', '0.7081', 1, 1, 1, 1, 1724766580.051486]