TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_46_58
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-007-021-06 | FUSED_ID : 6359364768387592534
  IC_TEMP :  -95.23 | VDDM : 1096.92 | AUX_INT :  -10.93 | CsaBias :   35.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74572e-03 / 2
  ADC_P0  : -1.09288e-02 ± 2.83105e-02
  ADC_P1  : 9.39452e-03 ± 7.68949e-04
  ADC_P2  : -7.15796e-06 ± 4.18791e-06
  CSA_Chi2/NDF : 6.45523e-05 / 2
  CSA_P0  : 5.96833e-02 ± 5.35893e-03
  CSA_P1  : 1.03619e-02 ± 4.03757e-04
  CSA_P2  : -7.64142e-05 ± 6.14874e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [4, 58, 68]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [8, 16, 39, 46, 91, 103, 113, 122]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2574', '1.800', '0.1651', '1.800', '0.0975', '7.000', '0.7083', 1, 1, 1, 1, 1724766417.477892]
VI_after__Init : ['1.201', '0.2571', '1.800', '0.1660', '1.800', '0.0900', '7.000', '0.7075', 1, 1, 1, 1, 1724766425.4812794]
VI_at__the_End : ['1.201', '0.4057', '1.800', '0.1345', '1.800', '0.1206', '7.000', '0.7080', 1, 1, 1, 1, 1724766487.991402]