TEST_NAME : Wafer
TEST_DATE : 24_08_27-15_45_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-007-022-06 | FUSED_ID : 6359364768387592550
  IC_TEMP :  -88.08 | VDDM : 1117.20 | AUX_INT :   -8.93 | CsaBias :   36.41
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25436e-03 / 2
  ADC_P0  : -8.92723e-03 ± 2.39641e-02
  ADC_P1  : 9.10305e-03 ± 6.31187e-04
  ADC_P2  : -7.20453e-06 ± 3.30167e-06
  CSA_Chi2/NDF : 1.05909e-04 / 2
  CSA_P0  : 5.62747e-02 ± 6.86419e-03
  CSA_P1  : 1.00511e-02 ± 5.17167e-04
  CSA_P2  : -6.89926e-05 ± 7.87585e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [2, 7, 9, 25, 36, 76, 84, 96, 114, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [11, 17, 49, 56, 77, 81, 105]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.2986', '1.800', '0.1796', '1.800', '0.0976', '7.000', '0.7083', 1, 1, 1, 1, 1724766321.5112972]
VI_after__Init : ['1.201', '0.2991', '1.800', '0.1801', '1.800', '0.0901', '7.000', '0.7075', 1, 1, 1, 1, 1724766330.120529]
VI_at__the_End : ['1.201', '0.4123', '1.800', '0.1345', '1.800', '0.1184', '7.000', '0.7081', 1, 1, 1, 1, 1724766388.1010768]