TEST_NAME : Wafer
TEST_DATE : 24_08_27-16_21_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-008-005-05 | FUSED_ID : 6359364768387596373
  IC_TEMP : -103.42 | VDDM : 1102.97 | AUX_INT :  -15.67 | CsaBias :   40.74
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 4.06612e-03 / 2
  ADC_P0  : -1.56651e-02 ± 4.34901e-02
  ADC_P1  : 9.43916e-03 ± 1.18158e-03
  ADC_P2  : -6.41771e-06 ± 6.53583e-06
  CSA_Chi2/NDF : 5.99564e-05 / 2
  CSA_P0  : 5.91956e-02 ± 5.16464e-03
  CSA_P1  : 1.02160e-02 ± 3.89119e-04
  CSA_P2  : -8.06859e-05 ± 5.92582e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [26, 37, 50, 55, 90, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [0, 40, 53, 61]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2464', '1.800', '0.1651', '1.799', '0.0968', '7.000', '0.7070', 1, 1, 1, 1, 1724768514.331416]
VI_after__Init : ['1.201', '0.2456', '1.800', '0.1669', '1.800', '0.0908', '7.000', '0.7072', 1, 1, 1, 1, 1724768522.5957716]
VI_at__the_End : ['1.202', '0.3809', '1.800', '0.1321', '1.800', '0.1226', '7.000', '0.7077', 1, 1, 1, 1, 1724768584.590953]